Defect density (D0)

Name: Defect density (D0)
Creator: Silicon Analysts

Point-in-time daily ledger of Defect density (D0) — every move dated and sourced.

Coverage window: 2026-06-07 → 2026-08-27 (844 rows)
Computed from the backing series at page-render time — never typed by hand.
History honesty: History accrues in place from the ledger start (2026-06-06) — append-only, never backfilled; depth before the start cannot exist.
Cadence: Ledger snapshots daily at 08:00 UTC; movements appear only when a value actually moves. Empty window = nothing moved.
Revision policy: Append-only: a frozen day is never edited or deleted (database-enforced). Corrections are registered in data_corrections and served alongside; restatements surface via /api/v1/changes.
Sources (source): Analyst Consensus, Initial Yield Reports (162) · Analyst Consensus based on ~50-60% Yield Reports (162) · Industry Expert Consensus (Mature FinFET) (104) · TechInsights Teardown Analysis, Analyst Reports (81) · Industry Expert Consensus (Historical Challenges) (81) · Industry Expert Consensus (Mature Planar) (81) · Based on historical 0.09 IEDM disclosure + Improvement (79) · Industry Expert Consensus (Samsung EUV, penalty vs TSMC N7) (23)
Known gaps: Known-gaps review pending — the coverage boundaries above are computed and current, but the curator’s qualitative gaps assessment has not been written yet. We state that rather than inventing one.
Access: Fully open
API: /api/v1/snapshot
Machine-readable: /api/v1/catalog/ledger-defect_density/contract