Adjust the chip dimensions, scribe line width, and edge exclusion values to see how the wafer map updates. Change the yield percentage to visualize the distribution of good and bad dies in real-time. The default values are set for an Nvidia H100 chip on a 300mm wafer.
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Wafer Map – Full and Partial Dies
Wafer Edge Exclusion
Gross Die Per Wafer (GDPW): -- dies
Wafer Map – Good vs Bad Dies
Good Dies
Bad Dies
Net Die Per Wafer (NDPW): -- dies
Gross Die Per Wafer (GDPW) represents the total number of dies that can fit on a wafer, considering the chip dimensions, scribe line width, and edge exclusion.
Net Die Per Wafer (NDPW) is calculated by multiplying the GDPW by the yield percentage, representing the number of functional (good) dies after manufacturing.
